• Modular multi-channel architecture: up to 8 channels per mainframe, extendable to 16, in a 4U rack-mount chassis.
• Both front and rear terminals fitted, selectable per test to cut connection errors and improve throughput.
• Single- and dual-channel modules with dynamic power distribution; dual-channel modules display both channels at once and allow custom left/right module layout.
• Seven operating modes (CC, CV, CR, CP, CV+CC, CR+CC, CW+CC) with maximum current limit (I-Limit) under CV/CR/CW to control inrush.
• Resolution and accuracy to 0.1 mV / 0.1 mA; voltage and current measurement up to 50 kHz.
• Dynamic mode up to 25 kHz with adjustable current rise/fall slope; List mode setting up to 100 kHz with continuous, pulse, and toggle modes.
• Battery test mode and time measurement from 0.1 ms to 100,000 s; automatic pass/fail test function.
• Full protection (OVP, OCP, OPP, OTP, anti-reverse); built-in Ethernet, USB, and RS232; adjustable CV loop speed and PLC setting.

• Multi-output power supply testing (each rail loaded independently and synchronously in one mainframe).
• Multi-rail SMPS, adapter, and charger production-line testing.
• DC-DC and AC-DC power module validation.
• Battery discharge and time-based testing.
• Aging and burn-in of electronic products (multi-channel, automatic pass/fail).
• R&D transient-response testing of switching power supplies using List and dynamic modes.

• Type: multi-channel, modular programmable DC electronic load
• Channel Scalability: Up to 8 channels per mainframe, extendable to 16 channels
• Form Factor: mainframe plus removable modules; 4U height; front and rear terminals, selectable
• Voltage Range: 80 V and 500 V classes
• Operating Modes: 7 (CC, CV, CR, CP, CV+CC, CR+CC, CW+CC), with I-Limit under CV/CR/CW
• Dynamic Mode: Up to 25 kHz, adjustable rise/fall slope; List mode setting up to 100 kHz (continuous, pulse, toggle)
• Measurement Speed: Up to 50 kHz voltage and current
• Measurement Resolution: to 0.1 mV / 0.1 mA
• Functions: List waveform simulation, battery test, time measurement 0.1 ms to 100,000 s, automatic test, adjustable CV loop speed, PLC setting, file storage 55 x 7 sets
• Protection: OVP, OCP, OPP, OTP, anti-reverse
• Mainframes: IT8701P (2-module), IT8702P (4-module), IT8703P (4-module expansion)
• Communication Interfaces: built-in Ethernet, USB, RS232

Module list (verified, voltage / current / power):

• IT8731P: 80 V / 40 A / 200 W.
• IT8732P: 80 V / 60 A / 400 W.
• IT8732BP: 500 V / 20 A / 300 W.
• IT8733P: 80 V / 120 A / 600 W.
• IT8733BP: 500 V / 30 A / 500 W.
• IT8722P: 80 V / 20 A / 250 W x 2CH (dual-channel, dynamic power distribution, total 300 W).
• IT8722BP: 500 V / 15 A / 250 W x 2CH (dual-channel, dynamic power distribution).
• IT8723P: 80 V / 45 A / 300 W x 2CH (dual-channel).

The ITECH IT8700P Series is a multi-channel, modular DC electronic load for engineers who test multi-output devices and want several independent loads in one 4U chassis. Removable modules let you build the load around the device under test: a single mainframe holds up to 8 channels and an extended frame reaches 16. Both front and rear terminals are fitted, so an operator can wire from the convenient side and reduce connection errors. It is an upgrade of the original IT8700 and keeps the same modular architecture.

Seven operating modes cover CC, CV, CR, CP and the compound modes CV+CC, CR+CC, and CW+CC. Under CV, CR, and CW, a maximum current limit (I-Limit) controls inrush so the test does not trip the DUT protection. Dual-channel modules add dynamic power distribution, letting one module split its rated power between two channels at the ratio your DUT needs, which saves slots and cost on multi-rail supplies.

Voltage and current measurement runs up to 50 kHz with resolution to 0.1 mV / 0.1 mA, the List mode and built-in waveform generator simulate complex load profiles, and an automatic test function returns pass/fail against your limits. Full protection (OVP, OCP, OPP, OTP, anti-reverse) and built-in Ethernet, USB, and RS232 support production and R&D use.