• Output power up to 1500W with wide range capability

• Dual voltage ranges: 60V and 150V

• Two current ranges with 1 μA resolution

• Low ripple and noise (linear + switching architecture)

• CC/CV priority modes for controlled transient response

• LIST programming with up to 100 steps and 10 sequences

• Built-in USB, LAN, and digital I/O; optional GPIB/RS232

• Comprehensive protection: OVP, UVP, OCP, OPP, OTP, Foldback

• DC-DC converter testing and validation

• Semiconductor and IC characterization

• Automotive electronics and power systems testing

• Photovoltaic (PV) module and energy system testing

• Battery charge/discharge testing

• Laser diode and optoelectronics testing

• Production line aging and reliability testing

• R&D laboratories and university research setups

• Voltage range: 60V / 150V

• Power rating: 800W / 1500W

• Current resolution: up to 1 μA

• Display: 4.3” LCD graphical interface

• Output structure: Linear + switching hybrid design

• Programming: SCPI, LabVIEW supported

• Interfaces: USB, LAN, Digital I/O (standard); GPIB/RS232 (optional)

• Protection: OVP, UVP, OCP, OPP, OTP, Foldback

• Additional functions: Data logging, trend analysis, LIST sequence programming

The IT-N6900 Programmable DC Power Supply is engineered to provide stable, low-noise DC output for testing and validation processes where accuracy and repeatability are critical. Combining linear and switching topology, the unit minimizes ripple while maintaining high efficiency, making it suitable for sensitive DUTs such as semiconductor devices, laser components, and communication electronics.

With output configurations up to 1500W and voltage ranges of 60V and 150V, the IT-N6900 supports a wide spectrum of power testing requirements. Its dual current range with 1 μA resolution allows precise control in both low-current and high-power scenarios. The integrated CC/CV priority function ensures controlled transitions without overshoot, reducing the risk of damaging sensitive components during dynamic testing.

For automated environments, the unit supports SCPI commands and LabVIEW drivers, with built-in USB, LAN, and digital I/O interfaces, and optional GPIB/RS232. Features such as LIST programming (up to 100 steps), data logging with trend analysis, and remote sensing enable efficient long-term testing and system integration.

Protection mechanisms including OVP, OCP, OPP, OTP, UVP, and Foldback safeguard both the power supply and the device under test, reducing operational risk in production and R&D environments.

For system integration, configuration, or application-specific requirements, AV-TEK Consulting can support proper selection and deployment within your test architecture.