• Ultra-compact 1U half-rack design with up to 1500W output

• Wide operating range up to 600V / 120A

• Modular multi-channel architecture (up to 256 channels)

• Programmable LIST mode (up to 100 steps) for dynamic waveform simulation

• CC/CV priority control for overshoot-free or high-speed testing

• Parallel operation with master-slave control

• Real-time waveform monitoring (TRACE function)

• Multiple communication protocols: CANopen, LXI, SCPI, Modbus

• Battery charge/discharge testing and validation

• EV power electronics and automotive component testing

• Semiconductor and IC testing environments

• R&D laboratories and design verification

• Automated test systems (ATE) integration

• Renewable energy and power conversion testing

• Laser and high-speed electronic device testing

• Output Power: up to 1500W

• Voltage Range: up to 600V

• Current Range: up to 120A

• Form Factor: 1U Half-Rack

• Channels: scalable up to 16×16 (256 channels)

• LIST Programming: up to 100 steps

• Communication Interfaces: RS232, LAN, USB, GPIB, CAN, RS485 (optional)

• Protocols: CANopen, LXI, SCPI, Modbus

• Protection Functions: OVP, OCP, OPP, OTP

• Synchronization Modes: On/Off, Track, Duplicate

The IT-M3100 series DC power supply is engineered for high-density, flexible power testing in industrial and laboratory environments. With up to 1500W output in a compact 1U half-rack design, it addresses space constraints without compromising performance, making it suitable for rack integration and automated test systems.

The system supports a wide operating envelope (up to 600V and 120A), allowing engineers to adapt voltage and current combinations based on power requirements. Its modular, multi-channel architecture enables scalable configurations up to 256 channels, supporting synchronized or independent operation for complex test scenarios.

Advanced features such as programmable LIST sequences (up to 100 steps), adjustable current rise/fall times, and CC/CV priority control allow precise simulation of dynamic load conditions. This is critical in applications where overshoot control, transient response, and repeatability directly impact test validity.

Integrated communication interfaces (CANopen, LXI, SCPI, Modbus) and optional cards support seamless integration into automated environments. Built-in protection functions (OVP, OCP, OPP, OTP) and battery testing capabilities reduce operational risk and improve test reliability.

Within AV-TEK Consulting’s portfolio, this solution is positioned not as a standalone instrument, but as part of a scalable power testing architecture for validation, compliance, and system integration.